|
KMID : 0381919990290030265
|
|
Korean Journal of Microscopy
1999 Volume.29 No. 3 p.265 ~ p.274
|
|
|
Microstructure Characterization of Cu Thin Films : Effects of Sputter Deposition Conditions
|
|
Joh Cheol-Ho
Jung Jin-Goo
Kim Young-Ho
|
|
|
Abstract
|
|
|
|
The microstructure of Cu thin films in various deposition conditions was characterized. Cr films (50 nm thick) and Cu films (500 or 1000 nm thick) were deposited on polyimide films by DC magnetron sputtering. The Ar pressure during Cu deposition was controlled to 5, 50 and 100 mtorr. The microstructure was characterized using conventional and high resolution SEM and TEM. As sputtering pressure increases, open boundaries are observed more frequently. The Cu film deposited at 5 mtorr has a dense and uniform structure, while low-density regions or open boundaries between columns exist in the film deposited at higher pressure. As the film grows thicker, open boundaries are wider and the density of open boundaries are higher. The comparison between SEM and TEM show that the small features shown in high resolution SEM are grains. High resolution SEM is very effective to characterize the microstructure of the thin films. One column in the films deposited at 50 and 100 mtorr consists of several grains, which are smaller than those deposited at 5 mtorr.
|
|
|
KEYWORD
|
|
|
Microstructure, Sputtering, Open boundaries, High resolution SEM, TEM
|
|
|
FullTexts / Linksout information
|
|
|
|
|
Listed journal information
|
|
|